Relationship between defect density and charge carrier transport in amorphous and microcrystalline silicon-Reference-Cited by-同舟云学术

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Relationship between defect density and charge carrier transport in amorphous and microcrystalline silicon

Published:2009-03-18 Issue:10 Volume:79 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Astakhov Oleksandr,Carius Reinhard,Finger Friedhelm,Petrusenko Yuri,Borysenko Valery,Barankov Dmytro

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.79.104205/fulltext

Reference95 articles.

1. Hydrogenated Amorphous Silicon

2. Light-induced metastable defects in hydrogenated amorphous silicon: A systematic study

3. Metastable Defects in Amorphous-Silicon Thin-Film Transistors

4. Fermi-level effect on steady-state and transient photoconductivity in microcrystalline silicon

5. Defects and recombination in microcrystalline silicon

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