Metastable Defects in Amorphous-Silicon Thin-Film Transistors
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.56.2215/fulltext
Reference12 articles.
1. Charge trapping instabilities in amorphous silicon‐silicon nitride thin‐film transistors
2. Electronic states at the hydrogenated amorphous silicon/silcon nitride interface
3. Annealing and light induced changes in the field effect conductance of amorphous silicon
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