Determining fundamental properties from diffraction: Electric field induced strain and piezoelectric coefficient-Reference-Cited by-同舟云学术

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Determining fundamental properties from diffraction: Electric field induced strain and piezoelectric coefficient

Published:2019-05-17 Issue:17 Volume:99 Page:
ISSN:2469-9950
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Hinterstein M.,Lee K.-Y.,Esslinger S.,Glaum J.,Studer A. J.,Hoffman M.,Hoffmann M. J.

Funder

Deutsche Forschungsgemeinschaft

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.99.174107/fulltext

Reference34 articles.

1. Study of Micro-Droplet Behavior for a Piezoelectric Inkjet Printing Device Using a Single Pulse Voltage Pattern

2. High Strain Piezoelectric Multilayer Actuators?A Material Science and Engineering Challenge

3. The piezoelectronic transistor: A nanoactuator-based post-CMOS digital switch with high speed and low power

4. Influence of lanthanum doping on the morphotropic phase boundary of lead zirconate titanate

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4. Surface Conditions after LASER Shock Peening of Steel and Aluminum Alloys Using Ultrafast Laser Pulses;Materials;2023-10-19

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