Single-scattering cluster calculations and Fourier-transform analyses of normal photoelectron diffraction
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.27.781/fulltext
Reference15 articles.
1. Normal Photoelectron Diffraction of the Se3dLevel in Se Overlayers on Ni(100)
2. Selective Structural Sensitivity and Simplified Computations of Angle-Resolved Ultraviolet Photoemission Spectroscopy
3. Normal photoelectron diffraction ofc(2×2)O(1s)−Ni(001)andc(2×2)S(2p)−Ni(001), with Fourier-transform analysis
4. Normal photoelectron diffraction studies of selenium and sulfur overlayers on Ni(011) and Ni(111)
5. Fourier-transform analysis of normal photoelectron diffraction data for surface-structure determination
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