Normal photoelectron diffraction studies of selenium and sulfur overlayers on Ni(011) and Ni(111)
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.26.1812/fulltext
Reference21 articles.
1. Normal photoelectron diffraction ofc(2×2)O(1s)−Ni(001)andc(2×2)S(2p)−Ni(001), with Fourier-transform analysis
2. Photoelectron-diffraction measurements of sulfur and selenium adsorbed on Ni(001)
3. Binding-Site Determination from Angle-Resolved Ultraviolet Photoemission Intensity Modulations—Classification of Initial States into Two Types
4. Structural Determination of Molecular Overlayer Systems with Normal Photoelectron Diffraction:c(2×2)CO-Ni(001) and(3×3)R30°CO-Ni(111)
5. Multiple-scattering approach to angle-resolved photoemission
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