Probing thermomechanical behavior of polymers at the nanometer scale with single-ion bombardment and scanning force microscopy

Author:

Papaléo R. M.,de Oliveira L. D.,Farenzena L. S.,de Araújo M. A.,Livi R. P.

Publisher

American Physical Society (APS)

Cited by 19 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Size characterization of ion tracks in PET and PTFE using SAXS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-12

2. Relaxation of surface tracks on polycarbonate thin films induced by MeV heavy-ion impacts;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-10

3. Relativistic Molecular Dynamics Simulations of Laser Ablation Process on the Xenon Solid;Journal of Heat Transfer;2009-01-27

4. Relaxation times of nanoscale deformations on the surface of a polymer thin film near and below the glass transition;Physical Review B;2006-09-28

5. Impact of 100MeV Au on the surface of relaxed Si0.5Ge0.5 alloy films studied by atomic force microscopy;Surface Science;2006-08

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