Strain in buried quantum wires: Analytical calculations and x-ray diffraction study
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.66.035310/fulltext
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1. Growth Mode and Characteristics of the O2-Oxidized Si(100) Surface Oxide Layer Observed by Real Time Photoemission Measurement
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3. Elastic and other associated properties ofC60
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