Electronic structure of Cr silicides and Si-Cr interface reactions
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.28.7000/fulltext
Reference50 articles.
1. Refractory silicides for integrated circuits
2. Interface metallurgy and electronic properties of silicides
3. Formation of vanadium silicides by the interactions of V with bare and oxidized Si wafers
4. Metal-Induced Surface States during Schottky-Barrier Formation on Si, Ge, and GaAs
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