Microscopic structure, discommensurations, and tiling of Si(111)/Cu-‘‘5×5’’
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.46.1860/fulltext
Reference14 articles.
1. Auger electron spectroscopy of Si
2. 7 × 7 Si(111)Cu interfaces: Combined LEED, AES and EELS measurements
3. Examination of the cu/si(111) 5×5 structure by scanning tunneling microscopy
4. Phase Separation on an Atomic Scale: The Formation of a Novel Quasiperiodic 2D Structure
5. Frustration in the Si(111) ‘‘pseudo 5×5’’ Cu structure directly observed by scanning tunneling microscopy
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