Examination of the cu/si(111) 5×5 structure by scanning tunneling microscopy
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.38.12696/fulltext
Reference22 articles.
1. Auger electron spectroscopy of Si
2. Formation and properties of the copper silicon(111) interface
3. 7 × 7 Si(111)Cu interfaces: Combined LEED, AES and EELS measurements
4. AES, LEED and TDS studies of Cu on Si(111)7 × 7 and Si(100)2 × 1
5. Atomic structure of the Cu/Si(111) interface by high-energy core-level Auger electron diffraction
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3. Effects of annealing processes on Cu x Si1-x thin films;Journal of Wuhan University of Technology-Mater. Sci. Ed.;2016-02
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