Ion irradiation of the native oxide/silicon surface increases the thermal boundary conductance across aluminum/silicon interfaces-Reference-Cited by-同舟云学术

Ion irradiation of the native oxide/silicon surface increases the thermal boundary conductance across aluminum/silicon interfaces

Published:2014-07-03 Issue:2 Volume:90 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Gorham Caroline S.,Hattar Khalid,Cheaito Ramez,Duda John C.,Gaskins John T.,Beechem Thomas E.,Ihlefeld Jon F.,Biedermann Laura B.,Piekos Edward S.,Medlin Douglas L.,Hopkins Patrick E.

Funder

Office of Naval Research

Army Research Office

U.S. Department of Energy

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.90.024301/fulltext

Reference65 articles.

1. Thermal Transport across Solid Interfaces with Nanoscale Imperfections: Effects of Roughness, Disorder, Dislocations, and Bonding on Thermal Boundary Conductance

2. Thermal boundary resistance

3. Nanoscale thermal transport

4. Energy dissipation and transport in nanoscale devices

5. Ultra-Low Thermal Conductivity in W/Al 2 O 3 Nanolaminates

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