Grazing incidence small-angle x-ray scattering study of self-organized SiGe wires
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.63.205318/fulltext
Reference20 articles.
1. Ordering of self-assembledSi1−xGexislands studied by grazing incidence small-angle x-ray scattering and atomic force microscopy
2. Grazing incidence small angle x-ray scattering from free-standing nanostructures
3. Grazing incidence small-angle x-ray scattering study of buried and free-standing SiGe islands in a SiGe/Si superlattice
4. Diffuse x-ray reflection from multilayers with stepped interfaces
5. Highly regular self-organization of step bunches during growth of SiGe on Si(113)
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