Electronic contributions to scanning-tunneling-microscopy images of an annealed β-SiC(111) surface
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.45.1327/fulltext
Reference20 articles.
1. 7 × 7 Reconstruction on Si(111) Resolved in Real Space
2. Electronic Structure of Localized Si Dangling-Bond Defects by Tunneling Spectroscopy
3. Voltage‐dependent scanning tunneling microscopy imaging of semiconductor surfaces
4. Structure of the Ag/Si(111) surface by scanning tunneling microscopy
5. Local electron states and surface geometry of Si(111)-√3 √3Ag
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