Separation of interactions by noncontact force microscopy-Reference-Cited by-同舟云学术

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Separation of interactions by noncontact force microscopy

Published:2000-04-15 Issue:16 Volume:61 Page:11151-11155
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Guggisberg M.,Bammerlin M.,Loppacher Ch.,Pfeiffer O.,Abdurixit A.,Barwich V.,Bennewitz R.,Baratoff A.,Meyer E.,Güntherodt H.-J.

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.61.11151/fulltext

Reference26 articles.

1. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy

2. Observation of $\bf 7\times 7$ Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy

3. Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy

4. Simultaneous imaging of Si(111) 7×7 with atomic resolution in scanning tunneling microscopy, atomic force microscopy, and atomic force microscopy noncontact mode

5. Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7

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