Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7-Reference-Cited by-同舟云学术

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Atomic resolution in dynamic force microscopy across steps on Si(1 1 1)7×7

Published:1996-03 Issue:2 Volume:100 Page:165-167
ISSN:0722-3277
Container-title:Zeitschrift für Physik B Condensed Matter
language:en
Short-container-title:Z. Phys. B

Author:

Lüthi R.,Meyer E.,Bammerlin M.,Baratoff A.,Lehmann T.,Howald L.,Gerber Ch.,Güntherodt H.-J.

Publisher

Springer Science and Business Media LLC

Subject

General Materials Science

Link

http://link.springer.com/content/pdf/10.1007/s002570050106.pdf

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