Evolution of the strain relaxation in a Ge layer on Si(001) by reconstruction and intermixing
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.60.R5121/fulltext
Reference16 articles.
1. Layer-by-layer growth of germanium on Si(100): strain-induced morphology and the influence of surfactants
2. STM study of initial stage of Ge epitaxy on Si(001)
3. Ge-Induced Reversal of Surface Stress Anisotropy on Si(001)
4. Missing dimers and strain relief in Ge films on Si(100)
5. Interplay of Stress, Structure, and Stoichiometry in Ge-Covered Si(001)
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1. Evolution of Ge wetting layers growing on smooth and rough Si (0 0 1) surfaces: Isolated {1 0 5} facets as a kinetic factor of stress relaxation;Applied Surface Science;2023-01
2. Study of intermixing effects in Ge/Si(001) growth using kinetic Monte Carlo simulations;Journal of Crystal Growth;2022-04
3. Evolution of Ge Wetting Layers Growing on Smooth and Rough Si (001) Surfaces: Isolated {105} Facets as a Kinetic Factor of Stress Relaxation;SSRN Electronic Journal;2022
4. The formation of a Sn monolayer on Ge(1 0 0) studied at the atomic scale;Applied Surface Science;2021-09
5. Kinetic Monte Carlo simulations of self-organization of Ge islands on Si(001);Physical Chemistry Chemical Physics;2021
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