Connection between the Meyer-Neldel relation and multiple-trapping transport
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.38.3595/fulltext
Reference27 articles.
1. Characterized of glow-discharge deposited a-Si:H
2. The Meyer-Neldel rule in field-effect measurements and the microscopic prefactor of the conductivity in a-Si: H
3. The Staebler-Wronski effect and the Meyer-Neldel rule in amorphous silicon
4. An investigation of the conductivity prefactor in a-Si as a function of Fermi level position using the field-effect experiment
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