The Meyer-Neldel rule in field-effect measurements and the microscopic prefactor of the conductivity in a-Si: H
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference14 articles.
1. The determination of characteristic parameters by the temperature dependent field-effect in a-Si:H thin film transistors
2. A self‐consistent analysis of temperature‐dependent field‐effect measurements in hydrogenated amorphous silicon thin‐film transistors
3. Effect of statistical fermi level shift on the Meyer-Neldel rule of a-Si:H conductivity
4. Field Effect in a-Si:H Films. Influence of Annealing and Light Exposure
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