Calibration and evaluation of scanning-force-microscopy probes
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.48.5675/fulltext
Reference18 articles.
1. Atomic Force Microscope
2. The London—van der Waals attraction between spherical particles
3. Dynamics of tip-substrate interactions in atomic force microscopy
4. van der Waals interactions between sharp probes and flat sample surfaces
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