Soft-x-ray photoemission study of chemisorption and Fermi-level pinning at the Cs/GaAs(110) and K/GaAs(110) interfaces
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.38.7568/fulltext
Reference33 articles.
1. Fermi-level position at a semiconductor-metal interface
2. Unified defect model and beyond
3. Metallic and atomic approximations at the Schottky barrier interfaces
4. Virtual gap states and Fermi level pinning by adsorbates at semiconductor surfaces
5. Calculation of Schottky barrier heights from semiconductor band structures
Cited by 115 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Nano-TiO2/TiN Systems for Electrocatalysis: Mapping the Changes in Energy Band Diagram across the Semiconductor|Current Collector Interface and the Study of Effects of TiO2 Electrochemical Reduction Using UV Photoelectron Spectroscopy;ACS Applied Materials & Interfaces;2024-09-04
2. Influence of Dry and Wet Etching on AlInSb Contact Resistivity, Transfer Length, and Sheet Resistance Using Circular Transmission Model;Journal of Electronic Materials;2023-01-20
3. Effect of Surface Treatment in Au/Ni/ n-GaN Schottky Contacts Formed on Cleaved m-Plane Surfaces of Free-Standing n-GaN Substrates;Journal of the Society of Materials Science, Japan;2022-10-15
4. Introductory guide to the application of XPS to epitaxial films and heterostructures;Journal of Vacuum Science & Technology A;2020-12
5. Electrical characteristics of n-GaN Schottky contacts on cleaved surfaces of free-standing substrates: Metal work function dependence of Schottky barrier height;Japanese Journal of Applied Physics;2018-03-20
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3