Structural investigation ofa-Si anda-Si:H using x-ray-absorption spectroscopy at the SiKedge-Reference-Cited by-同舟云学术

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Structural investigation ofa-Si anda-Si:H using x-ray-absorption spectroscopy at the SiKedge

Published:1989-11-15 Issue:14 Volume:40 Page:9636-9643
ISSN:0163-1829
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Filipponi A.,Evangelisti F.,Benfatto M.,Mobilio S.,Natoli C. R.

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.40.9636/fulltext

Reference31 articles.

1. Structure of glow discharge amorphous silicon

2. Structural investigation of hydrogenated amorphous silicon by X-ray diffraction

3. aSi:H short range order by neutron scattering

4. Computer Generation of Structural Models of Amorphous Si and Ge

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