Structural investigation of hydrogenated amorphous silicon by X-ray diffraction
Author:
Affiliation:
1. a Institut für Physik, Universität Dortmund , 4600, Dortmund , 50 , F.R. , Germany
Publisher
Informa UK Limited
Subject
General Physics and Astronomy,General Chemical Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/01418638108222109
Reference21 articles.
1. Analytic approximation to incoherently scattered X-ray intensities
2. A comparative study of the structure of evaporated and glow discharge silicon
3. Vibrational Amplitudes in Germanium and Silicon
4. Compton scattering in hydrogenated amorphous silicon
5. Infrared and Raman spectra of the silicon-hydrogen bonds in amorphous silicon prepared by glow discharge and sputtering
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