Direct mapping of theCoSi2/Si(111) interface by ballistic-electron-emission microscopy and modulation spectroscopy
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.50.14714/fulltext
Reference14 articles.
1. New Silicide Interface Model from Structural Energy Calculations
2. Investigation of the defect structure of thin single‐crystalline CoSi2(B) films on Si(111) by transmission electron microscopy
3. Mapping quantum-well energy profiles of III-V heterostructures by scanning-tunneling-microscope-excited luminescence
4. Observation of Interface Band Structure by Ballistic-Electron-Emission Microscopy
5. Tunneling Spectroscopy and Inverse Photoemission: Image and Field States
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