Total-electron-yield current measurements for near-surface extended x-ray-absorption fine structure
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.37.2450/fulltext
Reference42 articles.
1. Extended x-ray absorption fine structure—its strengths and limitations as a structural tool
2. Fluorescence detection of exafs: Sensitivity enhancement for dilute species and thin films
3. Possibility of adsorbate position determination using final-state interference effects
4. Extended X-Ray-Absorption Fine Structure of Surface Atoms on Single-Crystal Substrates: Iodine Adsorbed on Ag(111)
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