CaF2/Si(111): Thin-film characterization by high-resolution electron-energy-loss spectroscopy
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.34.7471/fulltext
Reference25 articles.
1. MBE‐grown fluoride films: A new class of epitaxial dielectrics
2. Silicon/insulator heteroepitaxial structures formed by vacuum deposition of CaF2 and Si
3. Analysis of epitaxial fluoride‐semiconductor interfaces
4. Epitaxial relations in group‐IIa fluoride/Si(111) heterostructures
5. Surface morphology of epitaxial CaF2films on Si substrates
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