Depth-dependent disordering ina-Si produced by self-ion-implantation
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.50.17080/fulltext
Reference18 articles.
1. Defect production and annealing in ion-implanted amorphous silicon
2. Structural relaxation and defect annihilation in pure amorphous silicon
3. Ion-beam-induced recrystallization in Si(100) studied with slow positron annihilation and Rutherford backscattering and channeling
4. Ion-beam-induced damage in silicon studied using variable-energy positrons, Rutherford backscattering, and infrared absorption
5. Transient structural relaxation of amorphous silicon
Cited by 30 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A re-examination of thin-film silicon’s Raman spectrum;Journal of Materials Science: Materials in Electronics;2024-05
2. Significant “smaller is softer” in amorphous silicon via irradiation-mediated surface modification;Journal of Materials Science & Technology;2023-12
3. Microstructure and phonon behavior in W/Si periodic multilayer structures;Journal of Physics D: Applied Physics;2022-02-02
4. Crystallinity, order, the thin-film silicon continuum, and the spectral dependence of the refractive index in thin silicon films grown through ultra-high-vacuum evaporation for a range of growth temperatures;Journal of Non-Crystalline Solids;2021-05
5. An amorphous-to-crystalline phase transition within thin silicon films grown by ultra-high-vacuum evaporation and its impact on the optical response;Journal of Applied Physics;2016-02-14
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3