X-ray line broadening due to an inhomogeneous dislocation distribution
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.57.7535/fulltext
Reference20 articles.
1. X-ray line-broadening study of the dislocation cell structure in deformed [001]-orientated copper single crystals
2. X-ray diffraction line broadening due to dislocations in non-cubic materials. I. General considerations and the case of elastic isotropy applied to hexagonal crystals
3. X-ray diffraction peaks due to misfit dislocations in heteroepitaxial structures
4. The Effect of Cold‐Work Distortion on X‐Ray Patterns
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