Defects at the Si(001)/a−SiO2 interface: Analysis of structures generated with classical force fields and density functional theory
Author:
Publisher
American Physical Society (APS)
Subject
Physics and Astronomy (miscellaneous),General Materials Science
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevMaterials.1.044602/fulltext
Reference72 articles.
1. Probing bulk defect energy bands using generalized charge pumping method
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4. Undetectability of the point defect as an interface state in thermal
5. What can electron paramagnetic resonance tell us about the Si/SiO[sub 2] system?
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