Analysis of nanometer-sized aligned conical pores using small-angle x-ray scattering-Reference-Cited by-同舟云学术

Analysis of nanometer-sized aligned conical pores using small-angle x-ray scattering

Published:2020-05-08 Issue:5 Volume:4 Page:
ISSN:2475-9953
Container-title:Physical Review Materials
language:en
Short-container-title:Phys. Rev. Materials

Author:

Hadley A.^ORCID,Notthoff C.^ORCID,Mota-Santiago P.^ORCID,Dutt S.^ORCID,Mudie S.,Carrillo-Solano M. A.,Toimil-Molares M. E.^ORCID,Trautmann C.^ORCID,Kluth P.^ORCID

Funder

Hemispheric Institute for the Americas

Australian Nuclear Science and Technology Organisation

Australian National University

GSI Helmholtzzentrum für Schwerionenforschung GmbH

Australian National Fabrication Facility

Australian Research Council

Deutsche Forschungsgemeinschaft

Publisher

American Physical Society (APS)

Subject

Physics and Astronomy (miscellaneous),General Materials Science

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevMaterials.4.056003/fulltext

Reference40 articles.

1. Track etching technique in membrane technology

2. Ion-Current Rectification in Nanopores and Nanotubes with Broken Symmetry

3. Etching threshold for ion tracks in polyimide

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