Annealing of swift heavy ion tracks in amorphous silicon dioxide-Reference-Cited by-同舟云学术

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Annealing of swift heavy ion tracks in amorphous silicon dioxide

Published:2023-08 Issue: Volume:628 Page:157370
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Dutt Shankar^ORCID,Notthoff Christian,Wang Xue,Trautmann Christina,Mota-Santiago Pablo^ORCID,Kluth Patrick^ORCID

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference80 articles.

1. Examination of fission fragment tracks with an electron microscope;Silk;Philos. Mag.,1959

2. Observations of Charged-Particle Tracks in Solids;Price;J. Appl. Phys.,1962

3. Charged particle tracks in glass;Fleischer;J. Appl. Phys.,1963

4. Fission track dating;Wagner,1992

5. Etching of radiation damage in lithium fluoride;Young;Nature,1958

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