X-ray-spectroscopy analysis of electron-cyclotron-resonance ion-source plasmas-Reference-Cited by-同舟云学术

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X-ray-spectroscopy analysis of electron-cyclotron-resonance ion-source plasmas

Published:2010-12-23 Issue:6 Volume:82 Page:
ISSN:1050-2947
Container-title:Physical Review A
language:en
Short-container-title:Phys. Rev. A

Author:

Santos J. P.,Costa A. M.,Marques J. P.,Martins M. C.,Indelicato P.,Parente F.

Publisher

American Physical Society (APS)

Subject

Atomic and Molecular Physics, and Optics

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevA.82.062516/fulltext

Reference85 articles.

1. Electron cyclotron resonance light source assembly—A vacuum-ultraviolet radiation source based on an electron cyclotron resonance plasma

2. He-like argon, chlorine and sulfur spectra measurement from an Electron Cyclotron Resonance Ion Trap

3. High-precision x-ray spectroscopy in few-electron ions

4. Highly charged ion densities and ion confinement properties in an electron-cyclotron-resonance ion source

5. Electronic temperatures, densities, and plasma x-ray emission of a 14.5 GHz electron-cyclotron resonance ion source

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