Magnetic Field Fingerprinting of Integrated-Circuit Activity with a Quantum Diamond Microscope-Reference-Cited by-同舟云学术

Magnetic Field Fingerprinting of Integrated-Circuit Activity with a Quantum Diamond Microscope

Published:2020-07-31 Issue:1 Volume:14 Page:
ISSN:2331-7019
Container-title:Physical Review Applied
language:en
Short-container-title:Phys. Rev. Applied

Author:

Turner Matthew J.,Langellier Nicholas^ORCID,Bainbridge Rachel,Walters Dan,Meesala Srujan,Babinec Thomas M.^ORCID,Kehayias Pauli,Yacoby Amir,Hu Evelyn,Lončar Marko,Walsworth Ronald L.^ORCID,Levine Edlyn V.^ORCID

Funder

Laboratory Directed Research and Development (LDRD) Program at Sandia National Laboratories

National Science Foundation

MITRE Corporation

Sandia National Laboratories Truman Fellowship Program

DARPA DRINQS program

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevApplied.14.014097/fulltext

Reference42 articles.

1. A Primer on Hardware Security: Models, Methods, and Metrics

2. Trustworthy Hardware: Trojan Detection and Design-for-Trust Challenges

3. Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain

4. Magnetic Field Imaging for non destructive 3D IC testing

5. Using a magnetometer to image a two‐dimensional current distribution

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