Interpretable and Efficient Interferometric Contrast in Scanning Transmission Electron Microscopy with a Diffraction-Grating Beam Splitter-Reference-Cited by-同舟云学术

Interpretable and Efficient Interferometric Contrast in Scanning Transmission Electron Microscopy with a Diffraction-Grating Beam Splitter

Published:2018-12-26 Issue:6 Volume:10 Page:
ISSN:2331-7019
Container-title:Physical Review Applied
language:en
Short-container-title:Phys. Rev. Applied

Author:

Harvey Tyler R.,Yasin Fehmi S.,Chess Jordan J.,Pierce Jordan S.,dos Reis Roberto M. S.,Özdöl Vasfi Burak,Ercius Peter,Ciston Jim,Feng Wenchun,Kotov Nicholas A.,McMorran Benjamin J.,Ophus Colin

Funder

National Science Foundation Graduate Research Fellowship Program

U.S. Department of Energy, Office of Science, Basic Energy Sciences

U.S. Department of Energy Early Career Research Program

NVIDIA

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevApplied.10.061001/fulltext

Reference48 articles.

1. Element-Selective Single Atom Imaging

2. Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy

3. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy

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5. Deciphering chemical order/disorder and material properties at the single-atom level

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