Temperature-Dependent Defect Production in Bombardment of Semiconductors
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRev.115.568/fulltext
Reference3 articles.
1. Electron-Bombardment Damage in Silicon
2. Annealing of Bombardment Damage in a Diamond-Type Lattice: Theoretical
3. Radiation Damage in Ge and Si Detected by Carrier Lifetime Changes: Damage Thresholds
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