X-Ray and Gamma-Ray Reflection Properties from 500 X Units to Nine X Units of Unstressed and of Bent Quartz Plates for Use in the Two-Meter Curved-Crystal Focusing Gamma-Ray Spectrometer-Reference-Cited by-同舟云学术

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X-Ray and Gamma-Ray Reflection Properties from 500 X Units to Nine X Units of Unstressed and of Bent Quartz Plates for Use in the Two-Meter Curved-Crystal Focusing Gamma-Ray Spectrometer

Published:1950-02-15 Issue:4 Volume:77 Page:475-490
ISSN:0031-899X
Container-title:Physical Review
language:en
Short-container-title:Phys. Rev.

Author:

Lind D. A.,West W. J.,DuMond J. W. M.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRev.77.475/fulltext

Reference20 articles.

1. A High Resolving Power, Curved‐Crystal Focusing Spectrometer for Short Wave‐Length X‐Rays and Gamma‐Rays

2. X-Ray Reflection from Inhomogeneously Strained Quartz

3. LXXVIII. The theory of X-ray reflexion. Part II

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