x-Ray Diffraction Spectrometry-Reference-Cited by-同舟云学术

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x-Ray Diffraction Spectrometry

Published:1975 Issue: Volume: Page:83-121
ISSN:
Container-title:Experimental Approaches and Applications
language:
Short-container-title:

Author:

CAUCHOIS Y.,BONNELLE C.

Publisher

Elsevier

Reference101 articles.

1. The Natural Widths of theKαX-Ray Doublet from 26FE to 47AG

2. Etude théorique de la propagation des rayons X dans un cristal parfait ou légèrement déformé

3. Barchewitz, R., M. Montel, and C. Bonnelle (1969). In Proc. Int. Congr. X-Ray Opt. Microanal., Tübingen, 1968. Springer-Verlag Berlin.

4. Barlier, M. (1959). Thèse Doctorat Troisième Cycle, Chimie Physique, Paris.

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1. Virtual standard for wavelength-dispersive electron-probe microanalysis;Microchimica Acta;2007-09-28

2. A high resolution X-ray crystal spectrometer to study electron and heavy-ion impact atomic collisions;Pramana;2007-06

3. Wavelength despersive spectroscopy analysis at high spectral resolution: application to the study of Mo/Si multilayers;X-Ray Spectrometry;2007

4. Neutron powder diffractometer beam line with a toroidally bent asymmetric crystal monochromator: Monte Carlo simulation studies;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2002-04

5. Introduction;Springer Series in Chemical Physics;1989

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