Wavelength despersive spectroscopy analysis at high spectral resolution: application to the study of Mo/Si multilayers-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Wavelength despersive spectroscopy analysis at high spectral resolution: application to the study of Mo/Si multilayers

Published:2007 Issue:2 Volume:36 Page:72-75
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Jonnard Philippe,Maury Hélène,André Jean-Michel

Publisher

Wiley

Subject

Spectroscopy

Reference19 articles.

1. Solid-state Spectroscopy. Springer-verlag: Berlin, 1998.

2. . Practical Surface Analysis. John Wiley and Sons: New York, 1983.

3. X-ray Spectroscopy. McGraw-Hill Inc.: New York, 1974.

4. X-ray Spectroscopy, Annual Report C. The Royal Society of Chemistry: London, 1987; 201.

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-Ray Fluorescence Determination of the Mass Absorption Coefficient in Two-Layer Co/Cr Thin-Film Systems;Journal of Applied Spectroscopy;2022-11

2. DETERMINATION OF THE MASS ABSORPTION COEFFICIENT IN TWO-LAYER Co/Cr THIN-FILM SYSTEMS BY THE X-RAY FLUORESCENCE METНOD;Journal of Applied Spectroscopy;2022-09-21

3. Study of buried interfaces in Fe/Si multilayer by hard x‐ray emission spectroscopy;Surface and Interface Analysis;2021-08-17

4. Account of Mutual Element Interference in the Analysis of Thin Bilayer V−Cr Systems by X-Ray Fluorescence;Journal of Analytical Chemistry;2020-02

5. Determination of the Mass Absorption Coefficient in Two-Layer Cr/Co Thin Film Systems by the X-Ray Fluorescence Method;Journal of Applied Spectroscopy;2020-01

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP