Charge-state distributions of scattered and recoil ions inC+–,F+–, andNe+–Si-surface collisions
Author:
Publisher
American Physical Society (APS)
Subject
Atomic and Molecular Physics, and Optics
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevA.49.1107/fulltext
Reference35 articles.
1. Collisions of Ar+ ions with surface Cu atoms and charge exchange of scattered ions near the metal surface
2. Multiply ionized atom production in keV-N+–Si-surface scattering
3. Doubly and triply charged ion production in O+—Si surface scattering
4. Comparison of ion-excited Auger electron emission and secondary ion emission from silicon bombarded with noble gas ions
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