Energy-loss distributions for 2.5-MeVHe+ions incident on Si single crystals

Author:

Boshart M. A.,Dygo A.,Seiberling L. E.

Publisher

American Physical Society (APS)

Subject

Atomic and Molecular Physics, and Optics

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Disparate Energy Scaling of Trajectory-Dependent Electronic Excitations for Slow Protons and He Ions;Physical Review Letters;2020-03-02

2. Channeling energy loss of He2+ in Si by transmission and back-scattering measurements: Experiments and computer modeling;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-06

3. Angular dependence for the energy loss of channeled He ions near the Si and directions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-05

4. Determining the stopping power of low energy helium in alkanethiolates with Neutral Impact Collision Ion Scattering Spectroscopy (NICISS);Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-09

5. Simulations of channeling spectra in the system p+28Si;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-05

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