Author:
Arafah D.-E.,Meyer J. D.,Sharabati H.,Mahmoud A.
Publisher
American Physical Society (APS)
Cited by
10 articles.
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1. Ion Microscopy;Springer Handbook of Microscopy;2019
2. Helium ion microscopy;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2014-03
3. Charge-state distributions of energetic 4He ions backscattered from Kr gas target;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2012-01
4. Coincident Rutherford Backscattering Spectrometry: A novel technique for measuring charge state distributions in violent ion–atom collisions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-10
5. Effect of sample bias on backscattered ion spectroscopy in the helium ion microscope;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2010-11