Defect Formation Energies without the Band-Gap Problem: Combining Density-Functional Theory and theGWApproach for the Silicon Self-Interstitial
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.102.026402/fulltext
Reference24 articles.
1. Accurate Exchange-Correlation Potential for Silicon and Its Discontinuity on Addition of an Electron
2. CombiningGWcalculations with exact-exchange density-functional theory: an analysis of valence-band photoemission for compound semiconductors
3. Exciting prospects for solids: Exact-exchange based functionals meet quasiparticle energy calculations
4. New Method for Calculating the One-Particle Green's Function with Application to the Electron-Gas Problem
5. Self- and foreign-atom diffusion in semiconductor isotope heterostructures. II. Experimental results for silicon
Cited by 220 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Compositional-Dependent Structural Parameters and Energetics of Hibonite: Quantum-Chemical Investigation;The Journal of Physical Chemistry A;2024-07-08
2. Identifying the charge states of carbon vacancies in 4H-SiC by ab initio metadynamics;Journal of Applied Physics;2024-04-02
3. Carrier-induced formation of electrically active boron-interstitial clusters in irradiated boron-doped silicon;Journal of Applied Physics;2024-02-01
4. Electrical tuning of quantum light emitters in hBN for free space and telecom optical bands;Scientific Reports;2024-01-08
5. Metal–insulator–semiconductor photoelectrodes for enhanced photoelectrochemical water splitting;Chemical Society Reviews;2024
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3