Author:
Picraux S. T.,Allen W. R.,Biefeld R. M.,Ellison J. A.,Chu W. K.
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Cited by
43 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Superfocusing and zero-degree focusing in planar channeling of protons in a thin silicon crystal;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-04
2. Rutherford Backscattering Spectrometry;Materials Characterization;2019
3. A study of small impact parameter ion channeling effects in thin crystals;The European Physical Journal B;2018-03
4. Azimuthal dependence and accurate determination of the half-angle in RBS channeling;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-10
5. Nanoscale Materials Defect Characterisation;Ion Beams in Nanoscience and Technology;2009