Nanoscale Materials Defect Characterisation-Reference-Cited by-同舟云学术

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Nanoscale Materials Defect Characterisation

Published:2009 Issue: Volume: Page:185-204
ISSN:1611-1052
Container-title:Ion Beams in Nanoscience and Technology
language:
Short-container-title:

Author:

Alves Eduardo,Breese Mark

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-642-00623-4_14.pdf

Reference60 articles.

1. J. Stark, Phys. Z., 13 (1912) 973.

2. M.T. Robinson and O.S. Oen, Phys. Rev., 132 (1963) 2385.

3. R.S. Nelson and M.W. Thompson, Phil. Mag., 8 (1963) 1677.

4. J.A. Davies, Foreign atom location, Channelling: Theory, Observation and Applications, John Wiley & Sons Ltd., New York, Chap. 13, ISBN 0-471-61510-2 (1973) 391–413.

5. L.C. Feldman, J.W. Mayer and S.T. Picraux, Materials Analysis by Ion Channelling: Submicron Crystallography, Academic Press, Inc., ISBN 0-12-252680-5 (1982).

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 50 years of ion channeling in materials science;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-03

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