Compound Formation at Cu-In Thin-Film Interfaces Detected by Perturbedγ−γAngular Correlations-Reference-Cited by-同舟云学术

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Compound Formation at Cu-In Thin-Film Interfaces Detected by Perturbedγ−γAngular Correlations

Published:1985-05-27 Issue:21 Volume:54 Page:2371-2374
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Keppner W.,Klas T.,Körner W.,Wesche R.,Schatz G.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.54.2371/fulltext

Reference6 articles.

1. Electric field gradients in metals

2. Impurity diffusion of114In in Cu

3. Sensitive Probing of Surfaces by Electric Quadrupole Interaction Demonstrated for Indium Metal

4. Constitution of Binary Alloys

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