Imaging of all Dangling Bonds and their Potential on theGe/Si(105)Surface by Noncontact Atomic Force Microscopy-Reference-Cited by-同舟云学术

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Imaging of all Dangling Bonds and their Potential on theGe/Si(105)Surface by Noncontact Atomic Force Microscopy

Published:2004-12-20 Issue:26 Volume:93 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Eguchi T.,Fujikawa Y.,Akiyama K.,An T.,Ono M.,Hashimoto T.,Morikawa Y.,Terakura K.,Sakurai T.,Lagally M. G.,Hasegawa Y.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.93.266102/fulltext

Reference20 articles.

1. Surface Studies by Scanning Tunneling Microscopy

2. Theory and Application for the Scanning Tunneling Microscope

3. Atomic Force Microscope

4. High resolution atomic force microscopy potentiometry

5. Kelvin probe force microscopy

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