Direct Measurement of the Polarization Dependence of Si(111)2×1 Surface-State Absorption by Use of Photothermal Displacement Spectroscopy
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.52.1148/fulltext
Reference27 articles.
1. Surface Structures and Properties of Diamond-Structure Semiconductors
2. Electron Paramagnetic Resonance from Clean Single-Crystal Cleavage Surfaces of Silicon
3. Experimental Evidence for One Highly Dispersive Dangling-Bond Band on Si(111) 2 × 1
4. Surface states on Si(111)-(2×1)
5. Si(111)2 × 1 studies by angle resolved photoemission
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