Fourier-Transformed Compton Profiles: A Sensitive Probe for the Microstructure of Semiconductors-Reference-Cited by-同舟云学术

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Fourier-Transformed Compton Profiles: A Sensitive Probe for the Microstructure of Semiconductors

Published:1977-05-23 Issue:21 Volume:38 Page:1227-1230
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Kramer B.,Krusius P.,Schröder W.,Schülke W.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.38.1227/fulltext

Reference4 articles.

1. Fermi surface parameters from the Fourier analysis of Compton profiles

2. Compton profiles of trigonal and amorphous selenium

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2. Electron momentum density in liquid silicon;Physical Review B;2013-09-16

3. Positron–electron autocorrelation function study of E-center in silicon;Journal of Applied Physics;2003-11

4. The bond directional principle for momentum space wavefunctions: comments and cautions;Chemical Physics;1988-07

5. Compton profile of LiH: a calculation based on the renormalised free-atom model;Journal of Physics C: Solid State Physics;1986-04-30

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