Lifetime and Coherence of Two-Level Defects in a Josephson Junction-Reference-Cited by-同舟云学术

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Lifetime and Coherence of Two-Level Defects in a Josephson Junction

Published:2010-10-19 Issue:17 Volume:105 Page:
ISSN:0031-9007
Container-title:Physical Review Letters
language:en
Short-container-title:Phys. Rev. Lett.

Author:

Shalibo Yoni,Rofe Ya’ara,Shwa David,Zeides Felix,Neeley Matthew,Martinis John M.,Katz Nadav

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.105.177001/fulltext

Reference19 articles.

1. Two-level states in glasses

2. Low- and High-Frequency Noise from Coherent Two-Level Systems

3. Decoherence of a Josephson qubit due to coupling to two-level systems

4. Individual defects at the Si:SiO2interface

5. A technique for suppressing dark current generated by interface states in buried channel CCD imagers

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