Hot Carrier Scattering at Interfacial Dislocations Observed by Ballistic-Electron-Emission Microscopy
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.73.577/fulltext
Reference17 articles.
1. Observation of Interface Band Structure by Ballistic-Electron-Emission Microscopy
2. Novel transport effects in high-bias ballistic-electron-emission spectroscopy
3. Diffusive and inelastic scattering in ballistic-electron-emission spectroscopy and ballistic-electron-emission microscopy
4. Hot electron scattering processes in metal films and at metal-semiconductor interfaces
5. Growth and characterization of epitaxial Ni and Co silicides
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