Real-space determination of atomic structure and bond relaxation at theNiSi2-Si(111) interface
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.54.827/fulltext
Reference6 articles.
1. Formation of Ultrathin Single-Crystal Silicide Films on Si: Surface and Interfacial Stabilization of Si-NiSi2Epitaxial Structures
2. Interfacial order in epitaxial NiSi2
3. Atomic structure of the NiSi2/(111)Si interface
4. The adsorption of Ag on the Si(111) 7×7 surface at room temperature studied by medium energy ion scattering, LEED and AES
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